Comprehensive Evaluation of Voltage Sags Based on Grid and Device Sensitivity Analysis

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CIRED 2019 - 485.pdf (244.05 KB)

Paper number

485

Working Group Number

Conference name

CIRED 2019

Conference date

3-6 June 2019

Conference location

Madrid, Spain

Peer-reviewed

Yes

Short title

Convener

Authors

Duan, Ruochen, Shanghai Municipal Electric Power Company, China
Zuo, Yiwen, Shanghai Municipal Electric Power Company, China
Chen, Yanjun, Shanghai Municipal Electric Power Company, China

Abstract

The existing indices of voltage sags are respectively describing voltage sags in the grid or the impact on electric devices, which are incomplete and inaccurate in a certain degree. In order to exactly evaluate the effects of voltage sags, the comprehensive evaluation index of voltage sags is proposed in the paper, where the improved statistical table of IEC 61000-2-8 and probability estimation of device outage are considered simultaneously. The improved analytic hierarchy process (AHP) is applied first to calculate the weight of voltage sag duration which the statistical index is extracted based on. Then the probability of device outage is obtained based on probabilistic models. Hence the voltage sag evaluation index considering voltage sags in the grid and the impact on electric utilities can be extracted via the entropy coefficient method. This evaluation method is applied to analyze voltage sags from the monitoring system of power quality of a city power grid. The results have shown that the proposed voltage sag evaluation index can describe the situation of voltage sags in monitoring sites more effectively, which is beneficial for the improvement of power quality and supply reliability.

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Publisher

AIM

Date

2019-06-03

Published in

CIRED 2019 Conference

Permanent link to this record

https://cired-repository.org/handle/20.500.12455/34
http://dx.doi.org/10.34890/78

ISSN

2032-9644

ISBN

978-2-9602415-0-1