THE NEED TO REDEFINE EMC STANDARDIZATION: POWER SPECTRAL DENSITY LIMITS OF NON-INTENTIONAL EMISSIONS FOR RELIABLE NB-PLC COMMUNICATIONS
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Paper number
1911
Working Group Number
Conference name
CIRED 2019
Conference date
3-6 June 2019
Conference location
Madrid, Spain
Peer-reviewed
Yes
Short title
Convener
Authors
Uribe-Perez, Noelia, Tecnalia, Spain
Arechalde, Ibon, Tecnalia, Spain
Sendín Escalona, Alberto, Iberdrola España, Spain
Fernandez, Ainara, Iberdrola, Spain
Gómez Guajardo, Juan Sebastián, Iberdrola España, Spain
Arechalde, Ibon, Tecnalia, Spain
Sendín Escalona, Alberto, Iberdrola España, Spain
Fernandez, Ainara, Iberdrola, Spain
Gómez Guajardo, Juan Sebastián, Iberdrola España, Spain
Abstract
Existing problems from Non-Intentional Emissions (NIE) over NB-PLC devices are well known to the community as well as widely covered in related researches and in reports of technical committees. Currently, the various limits set in different EMC standards for compatibility levels below 150 kHz are neither based on total power injected, nor based in real field measurements, so their validity may be questioned. In this sense, this paper presents a set of tests aiming at addressing both the influence of different emissions over different NB-PLC metering devices and the need to fix limits in the unintentional power injected in NB-PLC bands. The results and conclusions of the study present a valuable input for a fair coexistence between NB-PLC and electrical and electronic devices that can disturb signalling over LV grids below 150 kHz.The paper gives details of the performance evaluation of NB-PLC technologies, relevant for practicable smart meters implementation to improve resistance against NIE. Furthermore, the paper demonstrates that the power density of NIE should be limited in EMC standards to ensure a correct coexistence of NIE sources and NB-PLC technologies.
Table of content
Keywords
Publisher
AIM
Date
2019-06-03
Published in
Permanent link to this record
https://cired-repository.org/handle/20.500.12455/642
http://dx.doi.org/10.34890/866
http://dx.doi.org/10.34890/866
ISSN
2032-9644
ISBN
978-2-9602415-0-1