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dc.contributor.authorYe, Gu
dc.contributor.authorSans Ibos, Arnau
dc.contributor.authorCuk, Vladimir
dc.contributor.authorvan Waes, Jeroen
dc.contributor.authorCobben, Sjef
dc.date.accessioned2019-07-24T12:50:29Z
dc.date.available2019-07-24T12:50:29Z
dc.date.issued2019-06-03
dc.identifier.isbn978-2-9602415-0-1
dc.identifier.issn2032-9644
dc.identifier.urihttps://cired-repository.org/handle/20.500.12455/788
dc.identifier.urihttp://dx.doi.org/10.34890/1010
dc.description.abstractFrequency impedance scans are required for the harmonic assessment of new connections in the High Voltage grid. Most of the HV substations are connected to Distribution System Operators (DSO). In the Netherlands these MV grids are cabled with a typical length between 2 to 300 km. These downstream voltage networks may have significant influence on the total system impedance. For the HV network operator, it is almost impossible to model these grids in detail, so a simplification is therefore required. In this paper, a method to derive the simplified model of distribution networks based on a limited number of generalized MV feeders through a clustering process is described. After that, the parameter values (R, L, C’s) for equivalent models based on the generalized DSO networks are calculated and compared with other equivalent models found in the literature.
dc.language.isoen
dc.publisherAIM
dc.relation.ispartofseriesCIRED Conference Proceedings
dc.titleImpact of distribution network modelling on harmonic impedance in the HV grid
dc.typeConference Proceedings
dc.description.conferencelocationMadrid, Spain
dc.relation.ispartProc. of the 25th International Conference on Electricity Distribution (CIRED 2019)
dc.contributor.detailedauthorYe, Gu, Eindhoven University of Technology, Netherlands
dc.contributor.detailedauthorSans Ibos, Arnau , Eindhoven University of Technology, Netherlands
dc.contributor.detailedauthorCuk, Vladimir, Eindhoven University of Technology, Netherlands
dc.contributor.detailedauthorvan Waes, Jeroen , TenneT TSO B.V., Netherlands
dc.contributor.detailedauthorCobben, Sjef, Eindhoven University of Technology, Netherlands
dc.date.conferencedate3-6 June 2019
dc.description.peerreviewedYes
dc.title.number2306
dc.description.openaccessYes
dc.contributor.countryNetherlands
dc.contributor.countryNetherlands
dc.contributor.countryNetherlands
dc.contributor.countryNetherlands
dc.contributor.countryNetherlands
dc.description.conferencenameCIRED 2019
dc.contributor.affiliationEindhoven University of Technology
dc.contributor.affiliationEindhoven University of Technology
dc.contributor.affiliationEindhoven University of Technology
dc.contributor.affiliationTenneT TSO B.V.
dc.contributor.affiliationEindhoven University of Technology
dc.description.sessionPower quality and electromagnetic compatibility
dc.description.sessionidSession 2


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